Long-term risk of cardiovascular implantable electronic device-related infection after catheter ablation of atrial fibrillation
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Long-term risk of cardiovascular implantable electronic device-related infection after catheter ablation of atrial fibrillation. / Dinshaw, Leon; Meyer, Christian.
In: J CARDIOVASC ELECTR, Vol. 31, No. 1, 01.2020, p. 371-372.Research output: SCORING: Contribution to journal › Other (editorial matter etc.) › Research
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TY - JOUR
T1 - Long-term risk of cardiovascular implantable electronic device-related infection after catheter ablation of atrial fibrillation
AU - Dinshaw, Leon
AU - Meyer, Christian
PY - 2020/1
Y1 - 2020/1
KW - Atrial Fibrillation/surgery
KW - Catheter Ablation
KW - Heart
KW - Humans
KW - Infections
KW - Pulmonary Veins/surgery
U2 - 10.1111/jce.14279
DO - 10.1111/jce.14279
M3 - Other (editorial matter etc.)
C2 - 31750590
VL - 31
SP - 371
EP - 372
JO - J CARDIOVASC ELECTR
JF - J CARDIOVASC ELECTR
SN - 1045-3873
IS - 1
ER -