Long-term risk of cardiovascular implantable electronic device-related infection after catheter ablation of atrial fibrillation

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Long-term risk of cardiovascular implantable electronic device-related infection after catheter ablation of atrial fibrillation. / Dinshaw, Leon; Meyer, Christian.

in: J CARDIOVASC ELECTR, Jahrgang 31, Nr. 1, 01.2020, S. 371-372.

Publikationen: SCORING: Beitrag in Fachzeitschrift/ZeitungAndere (Vorworte u.ä.)Forschung

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Bibtex

@article{2a2fbd4d7ef54f6a8f25d245eaa1a0c5,
title = "Long-term risk of cardiovascular implantable electronic device-related infection after catheter ablation of atrial fibrillation",
keywords = "Atrial Fibrillation/surgery, Catheter Ablation, Heart, Humans, Infections, Pulmonary Veins/surgery",
author = "Leon Dinshaw and Christian Meyer",
year = "2020",
month = jan,
doi = "10.1111/jce.14279",
language = "English",
volume = "31",
pages = "371--372",
journal = "J CARDIOVASC ELECTR",
issn = "1045-3873",
publisher = "Wiley-Blackwell",
number = "1",

}

RIS

TY - JOUR

T1 - Long-term risk of cardiovascular implantable electronic device-related infection after catheter ablation of atrial fibrillation

AU - Dinshaw, Leon

AU - Meyer, Christian

PY - 2020/1

Y1 - 2020/1

KW - Atrial Fibrillation/surgery

KW - Catheter Ablation

KW - Heart

KW - Humans

KW - Infections

KW - Pulmonary Veins/surgery

U2 - 10.1111/jce.14279

DO - 10.1111/jce.14279

M3 - Other (editorial matter etc.)

C2 - 31750590

VL - 31

SP - 371

EP - 372

JO - J CARDIOVASC ELECTR

JF - J CARDIOVASC ELECTR

SN - 1045-3873

IS - 1

ER -